“Amidst the rapid evolution of IT technology, the semiconductor industry places increasing emphasis on reliability and productivity. While flying probe testers have traditionally been the go-to for PCB inspection, the FA1815-20 heralds a new era as the next-generation solution, poised to tackle the demands of precision and speed with unparalleled efficiency. What sets this tester apart is its groundbreaking approach to insulation resistance inspection, addressing concerns about potential board damage during high-voltage testing for high-resistance inspections. This innovation underscores Hioki’s dedication to delivering cutting-edge solutions that drive societal advancement.
Rohde & Schwarz Showcases Photonics-Based Ultra-Stable Tunable THz System for 6G at EuMW 2024
At European Microwave Week (EuMW) 2024 in Paris, Rohde & Schwarz is demonstrating a 6G wireless data transmission system built on a photonic THz communications link. This proof-of-concept represents the…